Ritesh P. Turakhia

Publication Activity (10 Years)

Years Active: 2004-2009
Publications (10 Years): 0

Publications

Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia
Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS (2009)
Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware
Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS (2009)
Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke
Silicon evaluation of longest path avoidance testing for small delay defects. ITC (2007)
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23 (2) (2006)
Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
Defect Screening Using Independent Component Analysis on I_DDQ. VTS (2005)
Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC (2004)