John Van Slyke

Publication Activity (10 Years)

Years Active: 2004-2007
Publications (10 Years): 0

Publications

Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke
Silicon evaluation of longest path avoidance testing for small delay defects. ITC (2007)
Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC (2004)