Login / Signup

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.

Brady BenwareCam LuJohn Van SlykePrabhu KrishnamurthyRobert MadgeMartin KeimMark KassabJanusz Rajski
Published in: ITC (2004)
Keyphrases
  • fault model
  • image processing
  • cost effective