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Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
Brady Benware
Cam Lu
John Van Slyke
Prabhu Krishnamurthy
Robert Madge
Martin Keim
Mark Kassab
Janusz Rajski
Published in:
ITC (2004)
Keyphrases
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fault model
image processing
cost effective