Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers.
Ritesh P. TurakhiaW. Robert DaaschJoel LurkinsBrady BenwarePublished in: IEEE Des. Test Comput. (2006)
Keyphrases
- data modeling
- database design
- data model
- database technology
- database management
- database development
- object oriented
- data warehousing
- conceptual data modeling
- relational model
- database processing
- database applications
- data mining
- data management
- physical database design
- missing data
- incomplete information
- sql server
- integrity constraints
- logical database design
- entity relationship modeling
- data warehouse
- data points
- query language
- database systems
- metadata
- machine learning