Joel Lurkins

Publication Activity (10 Years)

Years Active: 2005-2006
Publications (10 Years): 0

Publications

Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23 (2) (2006)
Joel Lurkins, DeAnna Hill, Brady Benware
Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. ITC (2005)