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Die-level adaptive test: Real-time test reordering and elimination.

Kapil R. GotkhindikarW. Robert DaaschKenneth M. ButlerJohn M. Carulli Jr.Amit Nahar
Published in: ITC (2011)
Keyphrases
  • real time
  • high speed
  • high level
  • vision system
  • statistical tests
  • machine learning
  • decision trees
  • multiscale
  • low cost
  • statistical significance