John M. Carulli Jr.

Publication Activity (10 Years)

Years Active: 2005-2016
Publications (10 Years): 3

Top Topics

Gaussian Process Models

Spatial Correlation

Top Venues

Publications

Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC (2016)
Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32 (1) (2015)
Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. DATE (2015)
Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. ITC (2014)
Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC (2014)
Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli Jr., Gautam Kapila, Min Chen
Reliability improvement of logic and clock paths in power-efficient designs. ACM J. Emerg. Technol. Comput. Syst. 10 (1) (2014)
Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. ITC (2014)
Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW (2013)
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Process monitoring through wafer-level spatial variation decomposition. ITC (2013)
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. DATE (2013)
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
On combining alternate test with spatial correlation modeling in analog/RF ICs. ETS (2013)
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
Spatial estimation of wafer measurement parameters using Gaussian process models. ITC (2012)
Ke Huang, John M. Carulli Jr., Yiorgos Makris
Parametric counterfeit IC detection via Support Vector Machines. DFT (2012)
Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
Spatial correlation modeling for probe test cost reduction in RF devices. ICCAD (2012)
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
Die-level adaptive test: Real-time test reordering and elimination. ITC (2011)
Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
Adapting to adaptive testing. DATE (2010)
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26 (5) (2009)
Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger
Quality improvement and cost reduction using statistical outlier methods. ICCD (2009)
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena
Modeling Test Escape Rate as a Function of Multiple Coverages. ITC (2008)
John M. Carulli Jr., Thomas J. Anderson
The Impact of Multiple Failure Modes on Estimating Product Field Reliability. IEEE Des. Test Comput. 23 (2) (2006)
John M. Carulli Jr., Thomas J. Anderson
Test connections - tying application to process. ITC (2005)