Parametric counterfeit IC detection via Support Vector Machines.

Ke Huang John M. Carulli Jr.Yiorgos Makris

Published in: DFT (2012)

Keyphrases

support vector
learning machines
false alarms
detection rate
automatic detection
large margin classifiers
object detection
detection accuracy
feature selection
detection method
kernel function
loss function
integrated circuit
hough transform
detection algorithm
computer vision
learning algorithm
real world