Peter Sarson

Publication Activity (10 Years)

Years Active: 2013-2019
Publications (10 Years): 24

Top Topics

Frequency Response

Pattern Classification

High Reliability

Top Venues

J. Electron. Test.

Publications

Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris
Automated Die Inking through On-line Machine Learning. IOLTS (2019)
Wim Dobbelaere, Marco Restifo, Peter Sarson
Innovative Practices on Automotive Test. VTS (2019)
Peter Sarson, Tomonori Yanagida, Kosuke Machida
Group delay measurement of frequency down-converter devices using chirped RF modulated signal. VTS (2018)
Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, Peter Sarson
Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard. IOLTS (2018)
Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson
IP session on ISO26262 EDA. VTS (2018)
Peter Sarson, Tomonori Yanagida, Kosuke Machida
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. J. Electron. Test. 34 (3) (2018)
Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev
Online information utility assessment for per-device adaptive test flow. VTS (2018)
Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment. J. Electron. Test. 34 (3) (2018)
Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson
Special session on BIST/calibration of A/MS devices. VTS (2018)
Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner
High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. VTS (2018)
Peter Sarson
Innovative practices session 7C automotive quality assurance. VTS (2017)
Peter Sarson
An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus. J. Electron. Test. 33 (3) (2017)
Stephen Sunter, Peter Sarson
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. ITC (2017)
Josip Mikulic, Peter Sarson, Gregor Schatzberger, Adrijan Baric
Fault-based test methodology for analog amplifier circuits. EWDTS (2017)
Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris
Automated die inking: A pattern recognition-based approach. ITC (2017)
Peter Sarson, Haruo Kobayashi
Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs. J. Electron. Test. 33 (3) (2017)
Enea Bagalini, Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, H. Klimesch, Peter Sarson
An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard. LATS (2017)
Peter Sarson, Jeff Rearick
Use models for extending IEEE 1687 to analog test. ITC (2017)
Peter Sarson, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi
A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm. VTS (2017)
Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson
Yield improvement of an EEPROM for automotive applications while maintaining high reliability. VTS (2016)
Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC (2016)
Peter Sarson
Test time efficient group delay filter characterization technique using a discrete chirped excitation signal. ITC (2016)
Peter Sarson
Group delay filter measurement using a chirp. ETS (2016)
Peter Sarson
Very low supply voltage room temperature test to screen low temperature soft blown fuse fails which result in a resistive bridge. ISQED (2016)
Peter Sarson
RF filter characterization using a chirp. IDT (2014)
Peter Sarson, Gregor Schatzberger, Robert Seitz
Automotive EEPROM Qualification and Cost Optimization. Asian Test Symposium (2013)