Wim Dobbelaere

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 21

Top Topics

Integrated Circuit

Top Venues

Publications

Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (10) (2023)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS (2023)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (11) (2022)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS (2020)
Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25 (5) (2020)
Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC (2020)
Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS (2020)
Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS (2020)
Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC (2019)
Wim Dobbelaere, Marco Restifo, Peter Sarson
Innovative Practices on Automotive Test. VTS (2019)
Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Des. Test 35 (3) (2018)
Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. IEEE Des. Test 35 (3) (2018)
Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick
Innovative practices on quality levels of A/MS devices. VTS (2018)
Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama
Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. ISCAS (2018)
Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
A very low cost and highly parallel DfT method for analog and mixed-signal circuits. ETS (2017)
Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC (2017)
Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
Automatic testing of analog ICs for latent defects using topology modification. ETS (2017)
Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
Effective DC fault models and testing approach for open defects in analog circuits. ITC (2016)
Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. ITC (2016)
Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen
Analog fault coverage improvement using final-test dynamic part average testing. ITC (2016)
Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. Integr. 55 (2016)
Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
Automatic generation of autonomous built-in observability structures for analog circuits. ETS (2015)
Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
Automated testing of mixed-signal integrated circuits by topology modification. VTS (2015)
Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere
Optimization of analog fault coverage by exploiting defect-specific masking. ETS (2014)
Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen
Design and test of analog circuits towards sub-ppm level. ITC (2014)