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Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.

Jhon GomezNektar XamaAnthony CoyetteRonny VanhoorenWim DobbelaereGeorges G. E. Gielen
Published in: VTS (2020)
Keyphrases
  • mixed signal
  • low power
  • multi channel
  • defect detection
  • vlsi circuits
  • high speed
  • signal processing
  • low cost
  • camera calibration
  • dynamical systems
  • latent variables
  • machine vision
  • simulation model