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Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.
Jhon Gomez
Nektar Xama
Anthony Coyette
Ronny Vanhooren
Wim Dobbelaere
Georges G. E. Gielen
Published in:
VTS (2020)
Keyphrases
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mixed signal
low power
multi channel
defect detection
vlsi circuits
high speed
signal processing
low cost
camera calibration
dynamical systems
latent variables
machine vision
simulation model