Jhon Gomez

Publication Activity (10 Years)

Years Active: 2019-2023
Publications (10 Years): 9

Top Topics

Defect Detection

Analog Circuits

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (10) (2023)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS (2023)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (11) (2022)
Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS (2020)
Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25 (5) (2020)
Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC (2020)
Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS (2020)
Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS (2020)
Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC (2019)