DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.
Jhon GomezNektar XamaAnthony CoyetteRonny VanhoorenWim DobbelaereGeorges G. E. GielenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)