Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.
Nektar XamaJhon GomezWim DobbelaereRonny VanhoorenAnthony CoyetteGeorges G. E. GielenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
- svm classifier
- mixed signal
- support vector machine
- low power
- multi channel
- vlsi circuits
- support vector machine svm
- support vector
- image classification
- feature selection
- feature vectors
- high speed
- training set
- learning algorithm
- semi supervised
- kernel function
- low cost
- cmos technology
- decision function
- digital circuits
- hyperplane
- ensemble methods
- svm classification
- support vectors
- text classification
- multi class
- cost sensitive
- neural network
- computer vision