Stephen Sunter

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 12

Top Topics

Markovian Decision

Random Sampling

Top Venues

IEEE Trans. Circuits Syst. I Regul. Pap.

Publications

Stephen Sunter, Vladimir Zivkovic, Bartlomiej Praselski
A Method for Simulating Mixed-Signal ATE Tests. VTS (2024)
Stephen Sunter, Krzysztof Jurga
Automated Observability Analysis for Mixed-Signal Circuits. VTS (2021)
Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC (2020)
Stephen Sunter
Analog Fault Simulation - a Hot Topic! ETS (2020)
Stephen Sunter
Efficient Analog Defect Simulation. ITC (2019)
Krzysztof Jurga, Stephen Sunter
Measuring mixed-signal test stimulus quality. ETS (2018)
Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson
IP session on ISO26262 EDA. VTS (2018)
Stephen Sunter, Peter Sarson
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. ITC (2017)
Stephen Sunter
Closing the loop between analog design and test. ISCAS (2016)
Stephen Sunter, Krzysztof Jurga, Andrew Laidler
Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test. IEEE Trans. Circuits Syst. I Regul. Pap. (12) (2016)
Stephen Sunter, Alessandro Valerio, Riccardo Miglierina
Automated measurement of defect tolerance in mixed-signal ICs. ITC (2016)
Stephen Sunter, Alessandro Valerio, Riccardo Miglierina
Measuring defect tolerance within mixed-signal ICs. ETS (2016)
Manuel J. Barragan, Gildas Léger, Florence Azaïs, Ronald D. Blanton, Adit D. Singh, Stephen Sunter
Special session: Hot topics: Statistical test methods. VTS (2015)
Haralampos-G. D. Stratigopoulos, Stephen Sunter
Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (12) (2014)
Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren
Practical random sampling of potential defects for analog fault simulation. ITC (2014)
Haralampos-G. D. Stratigopoulos, Stephen Sunter
Efficient Monte Carlo-based analog parametric fault modelling. VTS (2014)
Stephen Sunter, Saghir A. Shaikh, Qing Lin
Fast BIST of I/O Pin AC specifications and inter-chip delays. ITC (2014)