Fast BIST of I/O Pin AC specifications and inter-chip delays.
Stephen SunterSaghir A. ShaikhQing LinPublished in: ITC (2014)
Keyphrases
- built in self test
- input output
- ibm power processor
- ibm zenterprise
- low cost
- high speed
- high density
- analog vlsi
- main memory
- functional verification
- formal specification
- delay insensitive
- single chip
- intra class
- high level
- host computer
- vlsi implementation
- high bandwidth
- circuit design
- data transfer
- file system
- storage systems
- evolvable hardware
- functional requirements
- integrated circuit
- low power
- database