FUNCTIONAL VERIFICATION
Experts
- Rolf Drechsler
- Sofiène Tahar
- Masahiro Fujita
- Jacob A. Abraham
- Matteo Sonza Reorda
- Magdy S. Abadir
- Graziano Pravadelli
- Daniel Große
- Li-C. Wang
- Franco Fummi
- Randal E. Bryant
- Ernesto Sánchez
- Avi Ziv
- Miroslav N. Velev
- Julien Schmaltz
- Dominique Borrione
- Gerhard Schellhorn
- Maciej J. Ciesielski
- Eduard Cerny
- Biplab K. Sikdar
- Mamata Dalui
- Carlo A. Furia
- Wolfgang Reif
- Michael Fisher
- Phillip J. Restle
- Valeria Bertacco
- Mohamed Darouach
- Carl Pixley
- Maksim Jenihhin
- Todd M. Austin
- Görschwin Fey
- Jaan Raik
- Ali Habibi
- Nicola Bombieri
- Jayanta Bhadra
- Rainer Leupers
- Clark W. Barrett
- Trevor N. Mudge
- Robert Wille
Venues
- CoRR
- DAC
- Microprocess. Microsystems
- DATE
- ICCD
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Micro
- ITC
- IEEE J. Solid State Circuits
- ASP-DAC
- VLSI Design
- MTV
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Des. Test Comput.
- Sensors
- IEEE Trans. Computers
- ISQED
- ISCAS
- IEEE Access
- ICCAD
- IBM J. Res. Dev.
- HLDVT
- Microelectron. Reliab.
- FMCAD
- ISSCC
- IEEE Trans. Ind. Electron.
- DSD
- Computer
- CAV
- ISVLSI
- ICECS
- MEMOCODE
- ICASSP
- IACR Cryptol. ePrint Arch.
- CICC
- ACM Trans. Design Autom. Electr. Syst.
- ISCA
- ACM Great Lakes Symposium on VLSI
- Int. J. Softw. Tools Technol. Transf.
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