FUNCTIONAL VERIFICATION
Experts
- Sofiène Tahar
- Rolf Drechsler
- Masahiro Fujita
- Jacob A. Abraham
- Magdy S. Abadir
- Matteo Sonza Reorda
- Graziano Pravadelli
- Franco Fummi
- Li-C. Wang
- Daniel Große
- Avi Ziv
- Miroslav N. Velev
- Ernesto Sánchez
- Randal E. Bryant
- Julien Schmaltz
- Gerhard Schellhorn
- Eduard Cerny
- Maciej J. Ciesielski
- Biplab K. Sikdar
- Dominique Borrione
- Wolfgang Reif
- Mamata Dalui
- Phillip J. Restle
- Carlo A. Furia
- Michael Fisher
- Görschwin Fey
- Warren A. Hunt Jr.
- Xiaowei Li
- Karina R. G. da Silva
- Sung-Mo Kang
- Clark W. Barrett
- Christian Jacobi
- Valeria Bertacco
- Todd M. Austin
- Nicola Bombieri
- Rainer Leupers
- Jaan Raik
- Otmane Aït Mohamed
- Ali Habibi
Venues
- CoRR
- DAC
- Microprocess. Microsystems
- DATE
- ICCD
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Micro
- ITC
- IEEE J. Solid State Circuits
- ASP-DAC
- VLSI Design
- MTV
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Des. Test Comput.
- ISQED
- IEEE Trans. Computers
- Sensors
- IEEE Access
- IBM J. Res. Dev.
- ISCAS
- ICCAD
- HLDVT
- FMCAD
- Microelectron. Reliab.
- ISSCC
- Computer
- CAV
- ISVLSI
- DSD
- ICECS
- IEEE Trans. Ind. Electron.
- MEMOCODE
- ICASSP
- IACR Cryptol. ePrint Arch.
- ACM Trans. Design Autom. Electr. Syst.
- CICC
- ISCA
- ACM Great Lakes Symposium on VLSI
- ASYNC
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