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High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.
Jhon Gomez
Nektar Xama
Anthony Coyette
Ronny Vanhooren
Wim Dobbelaere
Georges G. E. Gielen
Published in:
ETS (2023)
Keyphrases
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low cost
test generation
signal processing
metadata
case study
image quality