Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.
Nektar XamaMartin AndraudJhon GomezBaris EsenWim DobbelaereRonny VanhoorenAnthony CoyetteGeorges G. E. GielenPublished in: ACM Trans. Design Autom. Electr. Syst. (2020)
Keyphrases
- analog circuits
- machine learning
- learning algorithm
- digital circuits
- feature selection
- fault diagnosis
- machine learning methods
- decision trees
- pattern recognition
- supervised learning
- machine learning algorithms
- knowledge acquisition
- data mining
- neural network
- support vector machine
- ensemble methods
- object oriented
- natural language processing
- high speed
- text classification
- information extraction
- active learning
- multi agent systems
- defect detection
- multiple classifier systems
- image processing