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Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.

Wim DobbelaereFrederik ColleAnthony CoyetteRonny VanhoorenNektar XamaJhon GomezGeorges G. E. Gielen
Published in: ITC (2019)
Keyphrases
  • vlsi circuits
  • defect detection
  • mixed signal
  • image processing
  • pattern recognition
  • digital images
  • multi view