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Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization.
Anthony Coyette
Baris Esen
Wim Dobbelaere
Ronny Vanhooren
Georges G. E. Gielen
Published in:
Integr. (2016)
Keyphrases
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integrated circuit
built in self test
optimization method
optimization algorithm
optimization problems
automatically generate
partial observability
printed circuit boards
combinatorial optimization
partially observable
hardware description language
successive approximation