Analog fault coverage improvement using final-test dynamic part average testing.
Wim DobbelaereRonny VanhoorenWilly De ManKoen MatthijsAnthony CoyetteBaris EsenGeorges G. E. GielenPublished in: ITC (2016)
Keyphrases
- test cases
- software testing
- test suite
- test sequences
- test data
- test case generation
- regression testing
- test generation
- dynamic environments
- genetic algorithm
- testing process
- test set
- object oriented
- social networks
- search engine
- artificial intelligence
- learning algorithm
- usability testing
- test data generation
- vlsi architecture
- real time