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Non-intrusive detection of defects in mixed-signal integrated circuits using light activation.
Baris Esen
Anthony Coyette
Nektar Xama
Wim Dobbelaere
Ronny Vanhooren
Georges G. E. Gielen
Published in:
ITC (2017)
Keyphrases
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integrated circuit
printed circuit boards
mixed signal
vlsi circuits
high speed
multi channel
electron beam
low power