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ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.

Anthony CoyetteBaris EsenNektar XamaGeorges G. E. GielenWim DobbelaereRonny Vanhooren
Published in: IEEE Des. Test (2018)
Keyphrases
  • integrated circuit
  • built in self test
  • mixed signal
  • electron beam
  • vlsi circuits
  • low cost
  • frequency domain
  • fourier transform
  • low power
  • image processing
  • multi channel
  • complex systems