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Design and test of analog circuits towards sub-ppm level.

Georges G. E. GielenWim DobbelaereRonny VanhoorenAnthony CoyetteBaris Esen
Published in: ITC (2014)
Keyphrases
  • neural network
  • analog circuits
  • pattern recognition
  • design process
  • compression algorithm
  • case study
  • computer aided
  • digital circuits
  • experimental design
  • data sets
  • data model
  • query language