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Effective DC fault models and testing approach for open defects in analog circuits.

Baris EsenAnthony CoyetteGeorges G. E. GielenWim DobbelaereRonny Vanhooren
Published in: ITC (2016)
Keyphrases
  • analog circuits
  • fault models
  • databases
  • neural network
  • data mining
  • artificial intelligence
  • fault diagnosis