Optimization of analog fault coverage by exploiting defect-specific masking.
Anthony CoyetteGeorges G. E. GielenRonny VanhoorenWim DobbelaerePublished in: ETS (2014)
Keyphrases
- neural network
- optimization problems
- discrete optimization
- constrained optimization
- optimization algorithm
- analog vlsi
- high level
- evolutionary algorithm
- domain specific
- database
- image compression
- defect detection
- optimization process
- optimization method
- higher level
- natural images
- computational complexity
- decision trees
- machine learning
- data sets