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Automatic testing of analog ICs for latent defects using topology modification.

Nektar XamaAnthony CoyetteBaris EsenWim DobbelaereRonny VanhoorenGeorges G. E. Gielen
Published in: ETS (2017)
Keyphrases
  • website
  • fully automatic
  • multiscale
  • topology preserving
  • topology preservation
  • data sets
  • image processing
  • data driven
  • semi automatic
  • analog circuits
  • defect classification