Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis.
Anthony CoyetteBaris EsenWim DobbelaereRonny VanhoorenGeorges G. E. GielenPublished in: ITC (2016)
Keyphrases
- integrated circuit
- interval analysis
- mixed signal
- vlsi circuits
- multi channel
- low power
- built in self test
- hardware description language
- signal processing
- autocalibration
- digital circuits
- printed circuit boards
- constrained optimization
- cmos technology
- high speed
- constraint propagation
- power consumption
- electron beam
- metal oxide semiconductor