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Automated testing of mixed-signal integrated circuits by topology modification.
Anthony Coyette
Baris Esen
Ronny Vanhooren
Wim Dobbelaere
Georges G. E. Gielen
Published in:
VTS (2015)
Keyphrases
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integrated circuit
mixed signal
vlsi circuits
low power
multi channel
electron beam
object oriented
power consumption
computer vision
efficient implementation