High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs.
Gregor SchatzbergerFriedrich Peter LeisenbergerPeter SarsonAndreas WiesnerPublished in: VTS (2018)
Keyphrases
- high reliability
- high precision
- low cost
- highly efficient
- high accuracy
- computationally efficient
- significant improvement
- dynamic programming
- experimental evaluation
- high efficiency
- real time
- computational complexity
- mutual information
- detection method
- cost function
- objective function
- optimization algorithm
- theoretical analysis
- preprocessing
- computational cost
- clustering method
- pairwise
- fully automatic
- support vector machine
- decision trees