Chun-Kai Hsu

Publication Activity (10 Years)

Years Active: 2008-2016
Publications (10 Years): 1

Top Topics

Spatial Patterns

Statistically Significant

Nearest Neighbor Rule

Top Venues

Publications

Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC (2016)
Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng
AdaTest: An efficient statistical test framework for test escape screening. ITC (2015)
Fan Lin, Chun-Kai Hsu, Alberto Giovanni Busetto, Kwang-Ting Cheng
Pairwise Proximity-Based Features for Test Escape Screening. ICCAD (2015)
Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng
Learning from Production Test Data: Correlation Exploration and Feature Engineering. ATS (2014)
Shuangyue Zhang, Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng, Hong Wang
Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction. DATE (2014)
Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng
Feature engineering with canonical analysis for effective statistical tests screening test escapes. ITC (2014)
Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC (2013)
Shin-Shiun Chen, Chun-Kai Hsu, Hsiu-Chuan Shih, Jen-Chieh Yeh, Cheng-Wen Wu
Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs. ASP-DAC (2013)
Chun-Kai Hsu, Li-Ming Denq, Mao-Yin Wang, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques. ATS (2008)