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Chun-Kai Hsu
Publication Activity (10 Years)
Years Active: 2008-2016
Publications (10 Years): 1
Top Topics
Spatial Patterns
Statistically Significant
Test Data
Nearest Neighbor Rule
Top Venues
ITC
ASP-DAC
ATS
DATE
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Publications
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Chun-Kai Hsu
,
Peter Sarson
,
Gregor Schatzberger
,
Friedrich Peter Leisenberger
,
John M. Carulli Jr.
,
Siddhartha Siddhartha
,
Kwang-Ting Cheng
Variation and failure characterization through pattern classification of test data from multiple test stages.
ITC
(2016)
Fan Lin
,
Chun-Kai Hsu
,
Kwang-Ting Cheng
AdaTest: An efficient statistical test framework for test escape screening.
ITC
(2015)
Fan Lin
,
Chun-Kai Hsu
,
Alberto Giovanni Busetto
,
Kwang-Ting Cheng
Pairwise Proximity-Based Features for Test Escape Screening.
ICCAD
(2015)
Fan Lin
,
Chun-Kai Hsu
,
Kwang-Ting Cheng
Learning from Production Test Data: Correlation Exploration and Feature Engineering.
ATS
(2014)
Shuangyue Zhang
,
Fan Lin
,
Chun-Kai Hsu
,
Kwang-Ting Cheng
,
Hong Wang
Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction.
DATE
(2014)
Fan Lin
,
Chun-Kai Hsu
,
Kwang-Ting Cheng
Feature engineering with canonical analysis for effective statistical tests screening test escapes.
ITC
(2014)
Chun-Kai Hsu
,
Fan Lin
,
Kwang-Ting Cheng
,
Wangyang Zhang
,
Xin Li
,
John M. Carulli
,
Kenneth M. Butler
Test data analytics - Exploring spatial and test-item correlations in production test data.
ITC
(2013)
Shin-Shiun Chen
,
Chun-Kai Hsu
,
Hsiu-Chuan Shih
,
Jen-Chieh Yeh
,
Cheng-Wen Wu
Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs.
ASP-DAC
(2013)
Chun-Kai Hsu
,
Li-Ming Denq
,
Mao-Yin Wang
,
Jing-Jia Liou
,
Chih-Tsun Huang
,
Cheng-Wen Wu
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.
ATS
(2008)