Li-Ming Denq

Publication Activity (10 Years)

Years Active: 2003-2012
Publications (10 Years): 0

Top Venues

Publications

Chun-Chuan Chi, Yung-Fa Chou, Ding-Ming Kwai, Yu-Ying Hsiao, Cheng-Wen Wu, Yu-Tsao Hsing, Li-Ming Denq, Tsung-Hsiang Lin
3D-IC BISR for stacked memories using cross-die spares. VLSI-DAT (2012)
Chin-Fu Li, Chi-Ying Lee, Chen-Hsing Wang, Shu-Lin Chang, Li-Ming Denq, Chun-Chuan Chi, Hsuan-Jung Hsu, Ming-Yi Chu, Jing-Jia Liou, Shi-Yu Huang, Po-Chiun Huang, Hsi-Pin Ma, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Chi-Hu Wang, Yung-Sheng Kuo, Chih-Tsun Huang, Tien-Yu Chang
A low-cost wireless interface with no external antenna and crystal oscillator for cm-range contactless testing. DAC (2011)
Mincent Lee, Li-Ming Denq, Cheng-Wen Wu
A Memory Built-In Self-Repair Scheme Based on Configurable Spares. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (6) (2011)
Chih-Yen Lo, Yu-Tsao Hsing, Li-Ming Denq, Cheng-Wen Wu
SOC Test Architecture and Method for 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (10) (2010)
Yu-Tsao Hsing, Li-Ming Denq, Chao-Hsun Chen, Cheng-Wen Wu
Economic Analysis of the HOY Wireless Test Methodology. IEEE Des. Test Comput. 27 (3) (2010)
Li-Ming Denq, Yu-Tsao Hsing, Cheng-Wen Wu
Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories. IEEE Des. Test Comput. 26 (2) (2009)
Chun-Kai Hsu, Li-Ming Denq, Mao-Yin Wang, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques. ATS (2008)
Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu, Ching-Cheng Tien, Chi-Hu Wang, Hsi-Pin Ma, Ying-Yen Chen, Yueh-Chih Hsu, Li-Ming Denq, Chien-Jung Chiu, Young-Wey Li, Chieh-Ming Chang
A prototype of a wireless-based test system. SoCC (2007)
Li-Ming Denq, Cheng-Wen Wu
A Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories. ATS (2007)
Li-Ming Denq, Tzu-chiang Wang, Cheng-Wen Wu
An Enhanced SRAM BISR Design with Reduced Timing Penalty. ATS (2006)
Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu
A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories. MTDT (2004)
Kuo-Liang Cheng, Jing-Reng Huang, Chih-Wea Wang, Chih-Yen Lo, Li-Ming Denq, Chih-Tsun Huang, Shin-Wei Hung, Jye-Yuan Lee
An SOC Test Integration Platform and Its Industrial Realization. ITC (2004)
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. MTDT (2003)