SOC Test Architecture and Method for 3-D ICs.
Chih-Yen LoYu-Tsao HsingLi-Ming DenqCheng-Wen WuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
- experimental evaluation
- fully automatic
- test data
- synthetic data
- preprocessing
- high accuracy
- machine learning
- segmentation method
- error rate
- computationally efficient
- mutual information
- dynamic programming
- k means
- pairwise
- computational complexity
- image processing
- probabilistic model
- significant improvement
- edge detection
- optimization algorithm
- clustering method
- detection method
- objective function
- similarity measure
- classification method
- real time
- statistical methods