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Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction.
Shuangyue Zhang
Fan Lin
Chun-Kai Hsu
Kwang-Ting Cheng
Hong Wang
Published in:
DATE (2014)
Keyphrases
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spatial patterns
prediction accuracy
pattern generator
statistically significant
databases
genetic algorithm
test cases
steady state
test data