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A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.
Hugo R. Gonçalves
Xin Li
Miguel V. Correia
Vítor Tavares
John M. Carulli Jr.
Kenneth M. Butler
Published in:
DATE (2015)
Keyphrases
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cost function
dynamic programming
cost reduction
np hard
learning algorithm
objective function
probabilistic model
convex hull
optimal solution
computational complexity
probability distribution
relevance feedback
simulated annealing