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Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.

Ali AhmadiKe HuangSuriyaprakash NatarajanJohn M. Carulli Jr.Yiorgos Makris
Published in: ITC (2014)
Keyphrases
  • spatio temporal
  • spatial and temporal
  • progressive sampling
  • image sequences
  • moving objects
  • reinforcement learning
  • sample size
  • conditional random fields
  • mathematical modeling