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Predicting die-level process variations from wafer test data for analog devices: A feasibility study.

Shyam Kumar DevarakondJennifer McCoyAmit NaharJohn M. Carulli Jr.Soumendu BhattacharyaAbhijit Chatterjee
Published in: LATW (2013)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data mining
  • testing process
  • data sets
  • learning algorithm
  • computer vision
  • reinforcement learning
  • training set
  • relational databases