Amit Nahar

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 14

Top Topics

Semiconductor Manufacturing

Bayesian Models

Spatial Correlation

Top Venues

Publications

V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris
Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. VTS (2023)
Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris
Machine Learning-Based Overkill Reduction through Inter-Test Correlation. VTS (2022)
Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris
Wafer-Level Adaptive Vmin Calibration Seed Forecasting. DATE (2019)
Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner
Special session on machine learning: How will machine learning transform test? VTS (2018)
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (12) (2017)
Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris
Wafer-level adaptive trim seed forecasting based on E-tests. ISCAS (2017)
Kenneth M. Butler, Amit Nahar, W. Robert Daasch
What we know after twelve years developing and deploying test data analytics solutions. ITC (2016)
Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS (2016)
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Harnessing fabrication process signature for predicting yield across designs. ISCAS (2016)
Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Harnessing process variations for optimizing wafer-level probe-test flow. ITC (2016)
Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
A machine learning approach to fab-of-origin attestation. ICCAD (2016)
David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar
Statistical outlier screening as a test solution health monitor. ITC (2016)
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD (2015)
Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield prognosis for fab-to-fab product migration. VTS (2015)
Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC (2014)
Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW (2013)
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
Die-level adaptive test: Real-time test reordering and elimination. ITC (2011)
Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
Adapting to adaptive testing. DATE (2010)
W. Robert Daasch, C. Glenn Shirley, Amit Nahar
Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. 26 (5) (2009)
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26 (5) (2009)
Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger
Quality improvement and cost reduction using statistical outlier methods. ICCD (2009)
Amit Nahar, W. Robert Daasch, Suresh Subramaniam
Burn-in reduction using principal component analysis. ITC (2005)