Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.
V. A. NiranjanDeepika NeethirajanConstantinos XanthopoulosD. WebsterAmit NaharYiorgos MakrisPublished in: VTS (2023)
Keyphrases
- outlier detection
- density ratio estimation
- machine learning
- knowledge discovery
- data mining
- detection algorithm
- detecting outliers
- fraud detection
- credit card fraud detection
- data streams
- detect outliers
- high dimensional datasets
- distance based outlier detection
- covariate shift
- learning algorithm
- test cases
- least squares
- learning tasks
- computer vision
- semi supervised learning
- machine learning algorithms
- density estimation
- high dimensional
- database
- text classification
- spatial outliers
- decision trees
- three dimensional
- change point detection
- data analysis
- credit card
- data points
- statistical methods
- test set
- signal processing