DISTANCE BASED OUTLIER DETECTION
Experts
- Fabrizio Angiulli
- Arthur Zimek
- Charu C. Aggarwal
- Hiroyuki Kitagawa
- Leman Akoglu
- Yue Zhao
- Sanjay Chawla
- Luigi Palopoli
- Shengchun Deng
- Lei Cao
- Zengyou He
- Erich Schubert
- Xiaofei Xu
- Feng Jiang
- Oussama Ghorbel
- Elke A. Rundensteiner
- Christos Faloutsos
- Xia Hu
- Mohamed Abid
- Saihua Cai
- Ruizhi Sun
- Daochen Zha
- Michael Georgiopoulos
- Xiyang Hu
- Jerry Chun-Wei Lin
- Longbing Cao
- Manish Gupta
- Mahsa Salehi
- Paul J. M. Havinga
- Ricardo J. G. B. Campello
- Yongjun Wang
- Youcef Djenouri
- Sicong Li
- Zheng Li
- Yuefei Sui
- Shengrui Wang
- N. N. R. Ranga Suri
- Jörg Sander
- Philip S. Yu
Venues
- CoRR
- IEEE Access
- ICDM
- KDD
- Expert Syst. Appl.
- Data Min. Knowl. Discov.
- Neurocomputing
- IEEE Trans. Knowl. Data Eng.
- SDM
- IJCNN
- ICDE
- Knowl. Based Syst.
- IEEE BigData
- Inf. Sci.
- Comput. Stat. Data Anal.
- Sensors
- CIKM
- Pattern Recognit. Lett.
- Stat. Methods Appl.
- Pattern Recognit.
- Multim. Tools Appl.
- ICDM Workshops
- Proc. VLDB Endow.
- Knowl. Inf. Syst.
- AAAI
- Commun. Stat. Simul. Comput.
- PAKDD (2)
- BMC Bioinform.
- J. Intell. Fuzzy Syst.
- IJCAI
- Bioinform.
- PAKDD
- ESANN
- SEBD
- Neural Comput. Appl.
- SIGMOD Conference
- IEEE Signal Process. Lett.
- ECML/PKDD (1)
- Int. J. Artif. Intell. Tools
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