DISTANCE BASED OUTLIER DETECTION
Experts
- Fabrizio Angiulli
- Arthur Zimek
- Hiroyuki Kitagawa
- Charu C. Aggarwal
- Leman Akoglu
- Yue Zhao
- Sanjay Chawla
- Zengyou He
- Shengchun Deng
- Lei Cao
- Erich Schubert
- Luigi Palopoli
- Xiaofei Xu
- Christos Faloutsos
- Xiyang Hu
- Daochen Zha
- Xia Hu
- Jerry Chun-Wei Lin
- Mohamed Abid
- Elke A. Rundensteiner
- Michael Georgiopoulos
- Feng Jiang
- Oussama Ghorbel
- Sicong Li
- Philip S. Yu
- Zheng Li
- Aoying Zhou
- Nirvana Meratnia
- Yue Zhao
- Jiawei Han
- Ricardo J. G. B. Campello
- Li Cheng
- Yongjun Wang
- Yuefei Sui
- N. N. R. Ranga Suri
- Hans-Peter Kriegel
- Shengrui Wang
- Paul J. M. Havinga
- Chris Giannella
Venues
- CoRR
- IEEE Access
- ICDM
- KDD
- Expert Syst. Appl.
- Data Min. Knowl. Discov.
- ICDE
- Neurocomputing
- IEEE Trans. Knowl. Data Eng.
- Knowl. Based Syst.
- IJCNN
- SDM
- IEEE BigData
- Comput. Stat. Data Anal.
- Inf. Sci.
- Stat. Methods Appl.
- CIKM
- Sensors
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- ICDM Workshops
- Pattern Recognit.
- Proc. VLDB Endow.
- Knowl. Inf. Syst.
- AAAI
- Commun. Stat. Simul. Comput.
- Neural Comput. Appl.
- ESANN
- J. Intell. Fuzzy Syst.
- PAKDD (2)
- BMC Bioinform.
- Bioinform.
- SEBD
- PAKDD
- IJCAI
- Stat. Comput.
- ICPR
- IEEE Signal Process. Lett.
- NIPS
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