DETECT OUTLIERS
Experts
- Fabrizio Angiulli
- Arthur Zimek
- Leman Akoglu
- Charu C. Aggarwal
- Luigi Palopoli
- Erich Schubert
- Hiroyuki Kitagawa
- Feng Jiang
- Yue Zhao
- Sanjay Chawla
- Oussama Ghorbel
- Longbing Cao
- Jörg Sander
- Mohamed Abid
- Michael Georgiopoulos
- Hans-Peter Kriegel
- Klemens Böhm
- Yuefei Sui
- Ricardo J. G. B. Campello
- Rachel Ben-Eliyahu-Zohary
- Manish Gupta
- Shengchun Deng
- Philip S. Yu
- Saihua Cai
- Xia Hu
- Zengyou He
- Daochen Zha
- Lei Cao
- Emmanuel Müller
- Xiaofei Xu
- Christian S. Jensen
- Guansong Pang
- Elke A. Rundensteiner
- Tung Kieu
- Le Gruenwald
- Xinwang Liu
- Ruizhi Sun
- Peter Filzmoser
- Ira Assent
Venues
- CoRR
- IEEE Access
- ICDM
- Expert Syst. Appl.
- KDD
- SDM
- IJCNN
- Sensors
- Inf. Sci.
- IEEE BigData
- Stat. Methods Appl.
- IEEE Trans. Knowl. Data Eng.
- ICDE
- Pattern Recognit. Lett.
- CIKM
- Knowl. Based Syst.
- AAAI
- Intell. Data Anal.
- Knowl. Inf. Syst.
- Comput. Stat. Data Anal.
- Neurocomputing
- IJCAI
- Multim. Tools Appl.
- Data Min. Knowl. Discov.
- BMC Bioinform.
- SIGMOD Conference
- Commun. Stat. Simul. Comput.
- ICMLA
- Bioinform.
- J. Intell. Fuzzy Syst.
- PAKDD (2)
- IEICE Trans. Inf. Syst.
- Neural Comput. Appl.
- ICDM Workshops
- ITC
- Clust. Comput.
- Adv. Data Anal. Classif.
- SSDBM
- MLDM
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend