DETECTING OUTLIERS
Experts
- Arthur Zimek
- Fabrizio Angiulli
- Leman Akoglu
- Yue Zhao
- Charu C. Aggarwal
- Luigi Palopoli
- Saihua Cai
- Hiroyuki Kitagawa
- Longbing Cao
- Lei Cao
- Erich Schubert
- Feng Jiang
- Mohamed Abid
- Michael Georgiopoulos
- Oussama Ghorbel
- Sanjay Chawla
- Hans-Peter Kriegel
- Elke A. Rundensteiner
- Jörg Sander
- Klemens Böhm
- Ruizhi Sun
- Daochen Zha
- Xia Hu
- Bin Yang
- Ji Zhang
- Ira Assent
- Manish Gupta
- Chang-Tien Lu
- Sicong Li
- Tung Kieu
- Guansong Pang
- Xiyang Hu
- Philip S. Yu
- Christian S. Jensen
- Ricardo J. G. B. Campello
- Yuefei Sui
- Milos Hauskrecht
- Jiawei Han
- Paul J. M. Havinga
Venues
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- Pattern Recognit. Lett.
- Comput. Stat. Data Anal.
- ICDM Workshops
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- Knowl. Inf. Syst.
- Knowl. Based Syst.
- IEEE Trans. Knowl. Data Eng.
- CIKM
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- Intell. Data Anal.
- BMC Bioinform.
- Pattern Recognit.
- Commun. Stat. Simul. Comput.
- IJCAI
- Data Min. Knowl. Discov.
- SIGMOD Conference
- Multim. Tools Appl.
- Neurocomputing
- Neural Comput. Appl.
- PAKDD (2)
- J. Intell. Fuzzy Syst.
- ISDA
- IGARSS
- Bioinform.
- ICMLA
- Int. J. Data Sci. Anal.
- ITC
- WAIM
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