DETECTING OUTLIERS
Experts
- Arthur Zimek
- Fabrizio Angiulli
- Leman Akoglu
- Charu C. Aggarwal
- Yue Zhao
- Saihua Cai
- Luigi Palopoli
- Hiroyuki Kitagawa
- Longbing Cao
- Erich Schubert
- Lei Cao
- Feng Jiang
- Mohamed Abid
- Sanjay Chawla
- Ruizhi Sun
- Michael Georgiopoulos
- Oussama Ghorbel
- Hans-Peter Kriegel
- Jörg Sander
- Xia Hu
- Klemens Böhm
- Elke A. Rundensteiner
- Daochen Zha
- Guansong Pang
- Ira Assent
- Chang-Tien Lu
- Milos Hauskrecht
- Jiawei Han
- Ricardo J. G. B. Campello
- Bin Yang
- Xiyang Hu
- Tung Kieu
- Sicong Li
- Philip S. Yu
- Ji Zhang
- Manish Gupta
- Yuefei Sui
- Christian S. Jensen
- Anna Koufakou
Venues
- CoRR
- IEEE Access
- Expert Syst. Appl.
- KDD
- ICDM
- Inf. Sci.
- IJCNN
- Sensors
- SDM
- ICDE
- IEEE BigData
- Pattern Recognit. Lett.
- Comput. Stat. Data Anal.
- Knowl. Inf. Syst.
- IEEE Trans. Knowl. Data Eng.
- Stat. Methods Appl.
- ICDM Workshops
- AAAI
- CIKM
- Knowl. Based Syst.
- Intell. Data Anal.
- Commun. Stat. Simul. Comput.
- Pattern Recognit.
- BMC Bioinform.
- IJCAI
- Neurocomputing
- SIGMOD Conference
- J. Intell. Fuzzy Syst.
- Data Min. Knowl. Discov.
- Multim. Tools Appl.
- Neural Comput. Appl.
- PAKDD (2)
- Appl. Soft Comput.
- ISDA
- Appl. Intell.
- ICMLA
- Comput. Stat.
- Qual. Reliab. Eng. Int.
- SAC
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