OUTLIER DETECTION
Experts
- Philip S. Yu
- Fabrizio Angiulli
- Leman Akoglu
- Arthur Zimek
- Masashi Sugiyama
- Christos Faloutsos
- Thomas Seidl
- Taghi M. Khoshgoftaar
- Charu C. Aggarwal
- Hans-Peter Kriegel
- João Gama
- Jiawei Han
- Ira Assent
- Elke A. Rundensteiner
- Jörg Sander
- Xuelong Li
- Claudia Plant
- Emmanuel Müller
- Yue Zhao
- Srinivasan Parthasarathy
- Feiping Nie
- Graham Cormode
- Longbing Cao
- Hiroyuki Kitagawa
- Klemens Böhm
- Aoying Zhou
- Yao Xie
- Ricardo J. G. B. Campello
- Christian Böhm
- Lei Cao
- Luigi Palopoli
- Ji Zhang
- David P. Woodruff
- Peer Kröger
- Erich Schubert
- Yong Shi
- Mohamed Abid
- Mourad Ouzzani
- Nan Tang
Venues
- CoRR
- IEEE Access
- Expert Syst. Appl.
- Sensors
- KDD
- ICDM
- Inf. Sci.
- ICASSP
- IJCNN
- ICDE
- AAAI
- Comput. Stat. Data Anal.
- CIKM
- Neurocomputing
- Pattern Recognit.
- SDM
- Knowl. Based Syst.
- Pattern Recognit. Lett.
- IEEE Trans. Knowl. Data Eng.
- ICML
- Multim. Tools Appl.
- 计算机科学
- SIGMOD Conference
- Knowl. Inf. Syst.
- BMC Bioinform.
- ICDM Workshops
- NeurIPS
- NIPS
- IGARSS
- EMBC
- SAC
- Remote. Sens.
- Commun. Stat. Simul. Comput.
- Data Min. Knowl. Discov.
- Intell. Data Anal.
- DaWaK
- IEEE BigData
- IEEE Trans. Signal Process.
- Proc. VLDB Endow.
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