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Wafer-level adaptive trim seed forecasting based on E-tests.

Constantinos XanthopoulosAli AhmadiSirish BoddikurapatiAmit NaharBob OrrYiorgos Makris
Published in: ISCAS (2017)
Keyphrases
  • databases
  • higher level
  • integrated circuit
  • levels of abstraction
  • statistical tests
  • lower level
  • adaptive learning
  • exchange rate
  • autoregressive model