Bob Orr

Publication Activity (10 Years)

Years Active: 2014-2017
Publications (10 Years): 6

Top Topics

Integrated Circuit

Machine Learning

Spatial Correlation

Top Venues

Publications

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (12) (2017)
Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris
Wafer-level adaptive trim seed forecasting based on E-tests. ISCAS (2017)
Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS (2016)
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Harnessing fabrication process signature for predicting yield across designs. ISCAS (2016)
Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Harnessing process variations for optimizing wafer-level probe-test flow. ITC (2016)
Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
A machine learning approach to fab-of-origin attestation. ICCAD (2016)
Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD (2015)
Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield prognosis for fab-to-fab product migration. VTS (2015)
Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC (2014)