Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.
Ali AhmadiHaralampos-G. D. StratigopoulosKe HuangAmit NaharBob OrrMichael PasJohn M. CarulliYiorgos MakrisPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)