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IC laser trimming speed-up through wafer-level spatial correlation modeling.

Constantinos XanthopoulosKe HuangAbbas PoonawalaAmit NaharBob OrrJohn M. Carulli Jr.Yiorgos Makris
Published in: ITC (2014)
Keyphrases
  • spatial correlation
  • integrated circuit
  • temporal correlation
  • massively parallel
  • database
  • case study
  • infrared
  • modeling framework
  • semiconductor manufacturing