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Harnessing process variations for optimizing wafer-level probe-test flow.

Ali AhmadiConstantinos XanthopoulosAmit NaharBob OrrMichael PasYiorgos Makris
Published in: ITC (2016)
Keyphrases
  • machine learning
  • database
  • process model
  • data sets
  • information systems
  • feature selection
  • face recognition
  • objective function
  • search algorithm
  • integrated circuit