Special session on machine learning: How will machine learning transform test?

Yiorgos Makris Amit Nahar Haralampos-G. D. Stratigopoulos Marc Hutner

Published in: VTS (2018)

Keyphrases

machine learning
special session
feature selection
artificial intelligence
data analysis
text classification
databases
data mining
information retrieval
computer vision
information systems
image processing
high dimensional
recent advances